The transition to multi-Gigabit serial data links introduces significant signal integrity design and system challenges for clock/PLL designers. At these high data rates, signal integrity becomes the most critical test for determining overall performance and interoperability. Wavecrest instruments have offered high-speed test capabilities to design engineers for over 10 years. This experience enables us to provide you with all the diagnostic tools for applications.

By increasing our reliance on PLL devices, we must learn better ways to debug, characterize and test our synchronous systems.
The Wavecrest SIA-3600C is uniquely qualified to debug, characterize and test PLL devices. The SIA-3600C combines high precision measurement and advanced analysis algorithms with high throughput to provide the most comprehensive PLL analysis solution on the market today.

The SIA-3600C can measure every critical characteristic of a PLL device including random and deterministic jitter, periodic jitter, adjacent cycle jitter, duty cycle, slew rate, voltage characteristics and PLL loop response.

The SIA-3600C provides both timing and amplitude compliance measurements in any environment, system or IC, electrical or optical**. Clock signals up to 6GHz can be analyzed.

It is the most comprehensive diagnostic signal integrity test solution on the market today. The SIA-3600C comes complete with the software necessary for serial data analysis and also has powerful software for characterizing Clocks and PLL outputs.

Click here for the 3600 data sheet.