The transition to multi-Gigabit
serial data links introduces significant signal integrity
design and system challenges for clock/PLL designers.
At these high data rates, signal integrity becomes the
most critical test for determining overall performance
and interoperability. Wavecrest instruments have offered
high-speed test capabilities to design engineers for
over 10 years. This experience enables us to provide
you with all the diagnostic tools for applications.
By increasing our reliance on
PLL devices, we must learn better ways to debug, characterize
and test our synchronous systems.
The Wavecrest SIA-3600C is uniquely qualified to debug,
characterize and test PLL devices. The SIA-3600C combines
high precision measurement and advanced analysis algorithms
with high throughput to provide the most comprehensive
PLL analysis solution on the market today.
The SIA-3600C can measure every critical characteristic
of a PLL device including random and deterministic jitter,
periodic jitter, adjacent cycle jitter, duty cycle,
slew rate, voltage characteristics and PLL loop response.
The SIA-3600C provides both timing
and amplitude compliance measurements in any environment,
system or IC, electrical or optical**. Clock signals
up to 6GHz can be analyzed.
It is the most comprehensive diagnostic signal integrity
test solution on the market today. The SIA-3600C comes
complete with the software necessary for serial data
analysis and also has powerful software for characterizing
Clocks and PLL outputs.
here for the 3600 data sheet.