Wavecrest SIA
 
 
 

Comprehensive Analysis from the Leader in Signal Integrity
For data rates above 1 Gb/s, signal integrity becomes the most critical issue for determining overall device performance, meaning more comprehensive analysis tools are required. By using WAVECREST's GigaView SA software with a sampling oscilloscope, it is now possible to significantly expand your analysis capabilities. You can quantify Random and Deterministic Jitter and Amplitude components, measure Total Jitter and Total Amplitude Noise to 10-16 BER and quantify Data Dependent Jitter. You can determine the horizontal and vertical eye opening to 10-16 BER in minutes. GigaView SA works with both Agilent and Tektronix sampling oscilloscopes ensuring your results will be the same independent of manufacturer.

Expand the capabilities of your sampling oscilloscope

  • Quantify Random and Deterministic Jitter and Noise

  • Determine Total Jitter to 10-16 BER

  • Determine Total Amplitude Noise to 10-16 BER

  • Quantify Data Dependent Jitter

Horizontal and vertical eye opening to 10-16 BER

Download the GigaView SA Datasheet

Download the GigaView SA Manual


Benefits of GigaView SA

  • Improved Diagnostic Capabilities for Sampling Oscilloscope

  • Compliance Measurement
    testing to 10-15 BER

  • High Throughput

  • Proven Technology

  • Platform Independent

Detailed Diagnostics for Timing and Amplitude Measurements
WAVECREST is the leader in signal integrity analysis because of the comprehensive diagnostic tools that take you beyond basic signal integrity measurements. The most time consuming part of signal integrity analysis is during the debug and characterization phases because determining and eliminating signal integrity problems is a lengthy process. With GigaView SA you can shorten the debug and characterization time considerably enabling you to get your product to market faster. The diagnostic capabilities include:

  • Identify jitter and noise sources by quantifying random and deterministic components for both timing jitter and amplitude noise. Improved diagnostic capabilities enables faster device characterization and improved problem isolation

  • Quantify DDJ on repeating patterns to determine device bandwidth limitations

Timing Jitter Analysis

Quantify Random and Deterministic Noise


Bathtub Curve Showing Horizontal Eye Opening to 10-16 BER

 

Data Dependent Jitter of a backplane as a function of bit position
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